Protein secondary structure signatures from energy loss spectra recorded in the electron microscope (English)
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In:
Journal of Microscopy
;
282
, 3
;
215-223
;
2021
- Article (Journal) / Electronic Resource
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Title:Protein secondary structure signatures from energy loss spectra recorded in the electron microscope
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Contributors:March, Katia ( author ) / Venkatraman, Kartik ( author ) / Truong, Chloe Du ( author ) / Williams, Dewight ( author ) / Chiu, Po‐Lin ( author ) / Rez, Peter ( author )
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Published in:Journal of Microscopy ; 282, 3 ; 215-223
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Publisher:
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Publication date:2021-06-01
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Size:9 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 282, Issue 3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 193
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TOC ‐ Issue Information| 2021
- 195
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Analysis of misidentifications in TEM characterisation of organic‐inorganic hybrid perovskite materialDeng, Yu‐Hao / Nest, Leon Georg et al. | 2021
- 205
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Indentation probe with optical fibre array‐based optical coherence tomography for material deformationMarrese, Marica / Paardekam, E.J. / Iannuzzi, Davide et al. | 2021
- 215
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Protein secondary structure signatures from energy loss spectra recorded in the electron microscopeMarch, Katia / Venkatraman, Kartik / Truong, Chloe Du / Williams, Dewight / Chiu, Po‐Lin / Rez, Peter et al. | 2021
- 224
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Estimation of an uncertainty budget and performance measurement for a dual‐wavelength Twyman‐Green interferometerIbrahim, Dahi Ghareab Abdelsalam et al. | 2021
- 239
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Aberration on excitation focal spot caused by oblique interface with refractive indices discontinuous and its correction with pure‐phase compensation for laser scanning microscopyZhu, Yueqiang / Zhang, Chen / Zhao, Wei / Wang, Jian / Wang, Kaige / Bai, Jintao et al. | 2021
- 250
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Site‐specific angular dependent determination of inelastic mean free path of 300 keV electrons in GaN nanorodsGhatak, Jay / Chatterjee, Abhijit / Shivaprasad, S. M. et al. | 2021
- 258
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Reconstructing 3D digital model without distortion for poorly conductive porous rock by nanoprobe‐assisted FIB‐SEM tomographyLiu, Jialong / Niu, Suyun / Li, Guoliang / Du, Zhongming / Zhang, Yuxing / Yang, Jijin et al. | 2021
- 267
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Optimizing the SEM specimen preparation method for accurate microanalysis of carbon nanotube/nanocluster hybridsYue, Nailin / Wang, Li / He, Xingquan / Liu, Hongyan / Zhang, Wei et al. | 2021