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Proportional gas counter for measuring photoemission under X-ray diffraction conditions
Tema Archive | 1981| -
Photoelectric phenomena accompanying diffraction of x rays in semiconducting crystals
Tema Archive | 1982| -
X-ray total external reflection fluorescence study of LB films on solid substrate
Tema Archive | 1993| -
Theoretical investigations of secondary emission yield and standing waves in curved crystals under dynamical Bragg diffraction of x-rays (Taupin problem)
Online Contents | 1993|Contributors: Kovalchuk, M.V. -
X-Ray Standing Waves in a Bent Crystal. Fluorescence and Photoemission Yield
Online Contents | 1993|Contributors: Kovalchuk, M.V. -
X-ray standing waves in LSM for characterization of ultra-thin films
Online Contents | 1993|Contributors: Kovalchuk, M.V. -
Direct measurements of X-ray anomalous transmission in six-beam Laue diffraction
Online Contents | 1993|Contributors: Kovalchuk, M.V. -
Multiple Diffraction in X-Ray Standing Wave Method: Photoemission Measurements
Online Contents | 1993|Contributors: Kovalchuk, M.V. -
New modification of X-ray standing waves above the surface of layered substrates under total external reflection conditions for structural characterization of organic layers
Online Contents | 1993|Contributors: Kovalchuk, M.V. -
X-ray standing waves on the surface of the crystal with the uniform strain gradient
Online Contents | 1994|Contributors: Kovalchuk, M.V. -
Investigation of heat treatment effects on Ni-C bilayer parameters by XRSW
Online Contents | 1994|Contributors: Kovalchuk, M.V.
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