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Synonyms were used for: REM
Search without synonyms: keywords:("REM")
Used synonyms:
- rasterelektronenmikroskop
- scanning electron microscopes
- sem
-
Particle deformation induced by AFM tapping under different setpoint voltages [9236-30]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Integrating electron microscopy into nanoscience and materials engineering programs [9236-23]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
A novel transmission electron imaging technique for observation of biological samples on a plate [9236-8]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Using scanning near-field microscopy to study photo-induced mass motions in azobenzene containing thin films [9236-35]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Scan mirrors relay for high resolution laser scanning systems [9236-34]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Teaching K-12 teachers and students about nanoscale science through microscopy [9236-52]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Three-dimensional surface reconstruction using scanning electron microscopy and the design of a nanostructured electron trap [9236-53]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Scanning microscopies 2015 : 29 September - 1 October 2015, Monterey, California, United States
TIBKAT | 2015|Keywords: Scanning electron microscopes -
A compact physical CD-SEM simulator for IC photolithography modeling applications [9236-42]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Design, technology, and application of integrated piezoresistive scanning thermal microscopy (SThM) microcantilever [9236-25]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
A novel approach for scanning electron microscopic observation in atmospheric pressure [9236-3]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Do electron flux and solar x-ray in juxtaposition prior a seismic event make signature? [9236-48]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
First experiences with 2D-mXRF analysis of gunshot residue on garment, tissue, and cartridge cases [9236-19]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
An electro-conductive organic coating for scanning electron microscopy (deja vu) [9236-21]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Assessing the viability of multi-electron beam wafer inspection for sub-20nm defects (Invited Paper) [9236-14]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Wavelet transform-based method of compensating dispersion for high resolution imaging in SDOCT [9236-31]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Confirmatory analysis of field-presumptive GSR test sample using SEM/EDS [9236-51]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Developing a quality assurance program for gunshot primer residue analysis [9236-20]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Rigorous quantitative elemental microanalysis by scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) with spectrum processing by NIST DTSA-II [9236-17]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Using the Hitachi SEM to engage learners and promote next generation science standards inquiry [9236-22]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes
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