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Complex procedure for the quantitative description of an Al-Si cast alloy microstructure
Tema Archive | 2006| -
New approach for the quantification of microstructures in nonoriented electrical steels
Tema Archive | 2003| -
The effect of strain rate and temperature on the tensile properties of Sn-3.5Ag solder
Tema Archive | 2005| -
Effect of stress gradients in the surface layer of beryllium on X-ray stress measurement
Tema Archive | 2002|
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