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Mega-electron-volt ultrafast electron diffraction at SLAC National Accelerator Laboratory
American Institute of Physics | 2015|Keywords: Microscopy and Imaging -
Fabrication of all diamond scanning probes for nanoscale magnetometry
Free accessAmerican Institute of Physics | 2016|Keywords: Microscopy and Imaging -
A virtual instrument to standardise the calibration of atomic force microscope cantilevers
American Institute of Physics | 2016|Keywords: Microscopy and Imaging -
Selective sensitivity in Kerr microscopy
American Institute of Physics | 2017|Keywords: Microscopy and Imaging -
Design and performance of a compact scanning transmission X-ray microscope at the Photon Factory
American Institute of Physics | 2016|Keywords: Microscopy and Imaging -
Scanning SQUID susceptometers with sub-micron spatial resolution
American Institute of Physics | 2016|Keywords: Microscopy and Imaging -
AtomicJ: An open source software for analysis of force curves
American Institute of Physics | 2014|Keywords: Microscopy and Imaging -
OMNY—A tOMography Nano crYo stage
Free accessAmerican Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Three dimensional live-cell STED microscopy at increased depth using a water immersion objective
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
CCD camera as feasible large-area-size x-ray detector for x-ray fluorescence spectroscopy and imaging
American Institute of Physics | 2017|Keywords: Microscopy and Imaging -
Low noise current preamplifier for qPlus sensor deflection signal detection in atomic force microscopy at room and low temperatures
American Institute of Physics | 2017|Keywords: Microscopy and Imaging -
A scanning tunneling microscope for spectroscopic imaging below 90 mK in magnetic fields up to 17.5 T
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Neutron and X-ray Tomography (NeXT) system for simultaneous, dual modality tomography
American Institute of Physics | 2017|Keywords: Microscopy and Imaging -
Tomography and imaging at the PSICHE beam line of the SOLEIL synchrotron
American Institute of Physics | 2016|Keywords: Microscopy and Imaging -
Edge-preserving reconstruction from sparse projections of limited-angle computed tomography using -regularized gradient prior
American Institute of Physics | 2017|Keywords: Microscopy and Imaging -
Nanomechanical and topographical imaging of living cells by atomic force microscopy with colloidal probes
American Institute of Physics | 2015|Keywords: Microscopy and Imaging -
OMNY PIN—A versatile sample holder for tomographic measurements at room and cryogenic temperatures
Free accessAmerican Institute of Physics | 2017|Keywords: Microscopy and Imaging -
An optimized software framework for real-time, high-throughput tracking of spherical beads
Free accessAmerican Institute of Physics | 2014|Keywords: Microscopy and Imaging -
Fast time-resolved electrostatic force microscopy: Achieving sub-cycle time resolution
American Institute of Physics | 2016|Keywords: Microscopy and Imaging -
Calibrated work function mapping by Kelvin probe force microscopy
American Institute of Physics | 2018|Keywords: Microscopy and Imaging
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