Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc Networks (English)
- New search for: Cho, J. H.
- New search for: Chen, I. R.
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- New search for: Cho, J. H.
- New search for: Chen, I. R.
- New search for: Feng, P. G.
In:
IEEE TRANSACTIONS ON RELIABILITY
;
59
, 1
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231-241
;
2010
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ISSN:
- Article (Journal) / Print
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Title:Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc Networks
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Contributors:
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Published in:IEEE TRANSACTIONS ON RELIABILITY ; 59, 1 ; 231-241
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Publisher:
- New search for: IEEE INSTITUTE OF ELECTRICAL AND ELECTRONICS
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Publication date:2010-01-01
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Size:11 pages
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ISSN:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 620.00452
- Further information on Dewey Decimal Classification
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Classification:
DDC: 620.00452 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 59, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Spare Routing Reliability for a Stochastic Flow Network Through Two Minimal Paths Under Budget ConstraintYi-Kuei Lin, et al. | 2010
- 2
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Extended Best Papers From the 2008 Asian International Workshop on Advanced Reliability Modeling - Spare Routing Reliability for a Stochastic Flow Network Through Two Minimal Paths Under Budget ConstraintPeng, C-Y et al. | 2010
- 11
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Useful Lifetime Prediction of Rubber Components Using Accelerated TestingChang Su Woo, / Sung Seen Choi, / Seong Beom Lee, / Hyun Sub Kim, et al. | 2010
- 18
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Availability Analysis of an Intrusion Tolerant Distributed Server System With Preventive MaintenanceUemura, T. / Dohi, T. / Kaio, N. et al. | 2010
- 30
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Progressive-Stress Accelerated Degradation Test for Highly-Reliable ProductsChien-Yu Peng, / Sheng-Tsaing Tseng, et al. | 2010
- 38
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Nonparametric Estimation of Decreasing Mean Residual Life With Type II Censored DataYan Shen, / Min Xie, / Loon Ching Tang, et al. | 2010
- 45
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Lifetime Data Analysis - Evaluating the Reliability Function and the Mean Residual Life for Equipment With Unobservable StatesPark, J J et al. | 2010
- 45
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Evaluating the Reliability Function and the Mean Residual Life for Equipment With Unobservable StatesGhasemi, A. / Yacout, S. / Ouali, M.-S. et al. | 2010
- 55
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Mean Residual Life Function, Associated Orderings and PropertiesNanda, A.K. / Bhattacharjee, S. / Balakrishnan, N. et al. | 2010
- 66
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Higher Order Equilibrium Life DistributionsAhmad, I.A. / Mugdadi, A.R. et al. | 2010
- 74
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Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation TestsJong In Park, / Suk Joo Bae, et al. | 2010
- 91
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Accelerated Testing - A Practical Application of Quantitative Accelerated Life Testing in Power Systems EngineeringGera, A E et al. | 2010
- 91
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A Practical Application of Quantitative Accelerated Life Testing in Power Systems EngineeringTurner, M.D. et al. | 2010
- 102
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Accelerated Degradation Tests Applied to Software Aging ExperimentsMatias, R. / Barbetta, P.A. / Trivedi, K.S. / Filho, P.J.F. et al. | 2010
- 115
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Accelerated Life Test Plans for Repairable Systems With Multiple Independent RisksXiao Liu, / Long-Ching Tang, et al. | 2010
- 128
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Demonstration Testing - A New Start-Up Demonstration TestShrestha, A et al. | 2010
- 128
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A New Start-Up Demonstration TestGera, A.E. et al. | 2010
- 132
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Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic DevicesTao Yuan, / Yue Kuo, et al. | 2010
- 132
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Burn-In - Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic DevicesGottumukkala, N R et al. | 2010
- 139
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Assessing 2-Dimensional Nanocomponent's Limiting ReliabilityEbrahimi, N. et al. | 2010
- 139
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Nanocomponents - Assessing 2-Dimensional Nanocomponent's Limiting ReliabilityLi, G-D et al. | 2010
- 145
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Decision Diagram Based Methods and Complexity Analysis for Multi-State SystemsShrestha, A. / Liudong Xing, / Yuanshun Dai, et al. | 2010
- 145
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Systems - Decision Diagram Based Methods and Complexity Analysis for Multi-State SystemsEryilmaz, S et al. | 2010
- 162
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Reliability of a System of k Nodes for High Performance Computing ApplicationsGottumukkala, N.R. / Nassar, R. / Paun, M. / Leangsuksun, C.B. / Scott, S.L. et al. | 2010
- 170
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A New Reliability Prediction Model in Manufacturing SystemsGuo-Dong Li, / Masuda, S. / Yamaguchi, D. / Nagai, M. et al. | 2010
- 178
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Conditional Lifetimes of Consecutive $k$-Out-of- $n$ SystemsEryilmaz, S. et al. | 2010
- 178
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Conditional Lifetimes of Consecutive Formula Not Shown -Out-of- Formula Not Shown SystemsEryilmaz, S. et al. | 2010
- 183
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Networks - Reliability of k Separate Minimal Paths Under Both Time and Budget ConstraintsYeh, W-C et al. | 2010
- 183
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Reliability of Formula Not Shown Separate Minimal Paths Under Both Time and Budget ConstraintsLin, Y. K. et al. | 2010
- 183
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Reliability of $k$ Separate Minimal Paths Under Both Time and Budget ConstraintsYi-Kuei Lin, et al. | 2010
- 191
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Modeling Link Events in High Reliability Networks With Support Vector MachinesFeijoo, J. / Rojo-Alvarez, J.L. / Sueiro, J.C. / Conde-Pardo, P. / Mata-Vigil-Escalera, J.L. et al. | 2010
- 203
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A New Efficient Algorithm for Generating All Minimal Tie-Sets Connecting Selected Nodes in a Mesh-Structured NetworkMalinowski, J. et al. | 2010
- 212
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A Particle Swarm Optimization Approach Based on Monte Carlo Simulation for Solving the Complex Network Reliability ProblemWei-Chang Yeh, / Yi-Cheng Lin, / Yuk Ying Chung, / Mingchang Chih, et al. | 2010
- 222
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A Genetic Programming Approach for Software Reliability ModelingCosta, E.O. / Pozo, A. / Vergilio, S.R. et al. | 2010
- 222
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Software Reliability - A Genetic Programming Approach for Software Reliability ModelingMerle, G et al. | 2010
- 231
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Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc NetworksJin-Hee Cho, / Ing-Ray Chen, / Phu-Gui Feng, et al. | 2010
- 231
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Security - Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc Networks| 2010
- 242
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Linear and Nonlinear Preventive Maintenance ModelsShaomin Wu, / Zuo, M.J. et al. | 2010
- 242
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Maintenance - Linear and Nonlinear Preventive Maintenance ModelsLange, Barbara H et al. | 2010
- 250
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Probabilistic Algebraic Analysis of Fault Trees With Priority Dynamic Gates and Repeated EventsMerle, G. / Roussel, J.-M. / Lesage, J.-J. / Bobbio, A. et al. | 2010
- 250
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Fault Trees - Probabilistic Algebraic Analysis of Fault Trees With Priority Dynamic Gates and Repeated Events| 2010
- 262
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IEEE Transactions on Reliability Information for authors| 2010
- 264
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Information for Authors| 2010
- 264
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TR Upcoming Events| 2010
- C1
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Table of contents| 2010
- C2
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IEEE Transactions on Reliability publication information| 2010
- C3
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IEEE Transactions on Reliability institutional listings| 2010