A Particle Swarm Optimization Approach Based on Monte Carlo Simulation for Solving the Complex Network Reliability Problem (English)
- New search for: Wei-Chang Yeh,
- New search for: Yi-Cheng Lin,
- New search for: Yuk Ying Chung,
- New search for: Mingchang Chih,
- New search for: Wei-Chang Yeh,
- New search for: Yi-Cheng Lin,
- New search for: Yuk Ying Chung,
- New search for: Mingchang Chih,
In:
IEEE Transactions on Reliability
;
59
, 1
;
212-221
;
2010
- Article (Journal) / Electronic Resource
-
Title:A Particle Swarm Optimization Approach Based on Monte Carlo Simulation for Solving the Complex Network Reliability Problem
-
Contributors:Wei-Chang Yeh, ( author ) / Yi-Cheng Lin, ( author ) / Yuk Ying Chung, ( author ) / Mingchang Chih, ( author )
-
Published in:IEEE Transactions on Reliability ; 59, 1 ; 212-221
-
Publisher:
- New search for: IEEE
-
Publication date:2010-03-01
-
Size:1328504 byte
-
ISSN:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Electronic Resource
-
Language:English
-
Source:
Table of contents – Volume 59, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
-
Spare Routing Reliability for a Stochastic Flow Network Through Two Minimal Paths Under Budget ConstraintYi-Kuei Lin, et al. | 2010
- 2
-
Extended Best Papers From the 2008 Asian International Workshop on Advanced Reliability Modeling - Spare Routing Reliability for a Stochastic Flow Network Through Two Minimal Paths Under Budget ConstraintPeng, C-Y et al. | 2010
- 11
-
Useful Lifetime Prediction of Rubber Components Using Accelerated TestingChang Su Woo, / Sung Seen Choi, / Seong Beom Lee, / Hyun Sub Kim, et al. | 2010
- 18
-
Availability Analysis of an Intrusion Tolerant Distributed Server System With Preventive MaintenanceUemura, T. / Dohi, T. / Kaio, N. et al. | 2010
- 30
-
Progressive-Stress Accelerated Degradation Test for Highly-Reliable ProductsChien-Yu Peng, / Sheng-Tsaing Tseng, et al. | 2010
- 38
-
Nonparametric Estimation of Decreasing Mean Residual Life With Type II Censored DataYan Shen, / Min Xie, / Loon Ching Tang, et al. | 2010
- 45
-
Lifetime Data Analysis - Evaluating the Reliability Function and the Mean Residual Life for Equipment With Unobservable StatesPark, J J et al. | 2010
- 45
-
Evaluating the Reliability Function and the Mean Residual Life for Equipment With Unobservable StatesGhasemi, A. / Yacout, S. / Ouali, M.-S. et al. | 2010
- 55
-
Mean Residual Life Function, Associated Orderings and PropertiesNanda, A.K. / Bhattacharjee, S. / Balakrishnan, N. et al. | 2010
- 66
-
Higher Order Equilibrium Life DistributionsAhmad, I.A. / Mugdadi, A.R. et al. | 2010
- 74
-
Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation TestsJong In Park, / Suk Joo Bae, et al. | 2010
- 91
-
Accelerated Testing - A Practical Application of Quantitative Accelerated Life Testing in Power Systems EngineeringGera, A E et al. | 2010
- 91
-
A Practical Application of Quantitative Accelerated Life Testing in Power Systems EngineeringTurner, M.D. et al. | 2010
- 102
-
Accelerated Degradation Tests Applied to Software Aging ExperimentsMatias, R. / Barbetta, P.A. / Trivedi, K.S. / Filho, P.J.F. et al. | 2010
- 115
-
Accelerated Life Test Plans for Repairable Systems With Multiple Independent RisksXiao Liu, / Long-Ching Tang, et al. | 2010
- 128
-
A New Start-Up Demonstration TestGera, A.E. et al. | 2010
- 128
-
Demonstration Testing - A New Start-Up Demonstration TestShrestha, A et al. | 2010
- 132
-
Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic DevicesTao Yuan, / Yue Kuo, et al. | 2010
- 132
-
Burn-In - Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic DevicesGottumukkala, N R et al. | 2010
- 139
-
Nanocomponents - Assessing 2-Dimensional Nanocomponent's Limiting ReliabilityLi, G-D et al. | 2010
- 139
-
Assessing 2-Dimensional Nanocomponent's Limiting ReliabilityEbrahimi, N. et al. | 2010
- 145
-
Systems - Decision Diagram Based Methods and Complexity Analysis for Multi-State SystemsEryilmaz, S et al. | 2010
- 145
-
Decision Diagram Based Methods and Complexity Analysis for Multi-State SystemsShrestha, A. / Liudong Xing, / Yuanshun Dai, et al. | 2010
- 162
-
Reliability of a System of k Nodes for High Performance Computing ApplicationsGottumukkala, N.R. / Nassar, R. / Paun, M. / Leangsuksun, C.B. / Scott, S.L. et al. | 2010
- 170
-
A New Reliability Prediction Model in Manufacturing SystemsGuo-Dong Li, / Masuda, S. / Yamaguchi, D. / Nagai, M. et al. | 2010
- 178
-
Conditional Lifetimes of Consecutive $k$-Out-of- $n$ SystemsEryilmaz, S. et al. | 2010
- 178
-
Conditional Lifetimes of Consecutive Formula Not Shown -Out-of- Formula Not Shown SystemsEryilmaz, S. et al. | 2010
- 183
-
Networks - Reliability of k Separate Minimal Paths Under Both Time and Budget ConstraintsYeh, W-C et al. | 2010
- 183
-
Reliability of Formula Not Shown Separate Minimal Paths Under Both Time and Budget ConstraintsLin, Y. K. et al. | 2010
- 183
-
Reliability of $k$ Separate Minimal Paths Under Both Time and Budget ConstraintsYi-Kuei Lin, et al. | 2010
- 191
-
Modeling Link Events in High Reliability Networks With Support Vector MachinesFeijoo, J. / Rojo-Alvarez, J.L. / Sueiro, J.C. / Conde-Pardo, P. / Mata-Vigil-Escalera, J.L. et al. | 2010
- 203
-
A New Efficient Algorithm for Generating All Minimal Tie-Sets Connecting Selected Nodes in a Mesh-Structured NetworkMalinowski, J. et al. | 2010
- 212
-
A Particle Swarm Optimization Approach Based on Monte Carlo Simulation for Solving the Complex Network Reliability ProblemWei-Chang Yeh, / Yi-Cheng Lin, / Yuk Ying Chung, / Mingchang Chih, et al. | 2010
- 222
-
A Genetic Programming Approach for Software Reliability ModelingCosta, E.O. / Pozo, A. / Vergilio, S.R. et al. | 2010
- 222
-
Software Reliability - A Genetic Programming Approach for Software Reliability ModelingMerle, G et al. | 2010
- 231
-
Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc NetworksJin-Hee Cho, / Ing-Ray Chen, / Phu-Gui Feng, et al. | 2010
- 231
-
Security - Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc Networks| 2010
- 242
-
Linear and Nonlinear Preventive Maintenance ModelsShaomin Wu, / Zuo, M.J. et al. | 2010
- 242
-
Maintenance - Linear and Nonlinear Preventive Maintenance ModelsLange, Barbara H et al. | 2010
- 250
-
Fault Trees - Probabilistic Algebraic Analysis of Fault Trees With Priority Dynamic Gates and Repeated Events| 2010
- 250
-
Probabilistic Algebraic Analysis of Fault Trees With Priority Dynamic Gates and Repeated EventsMerle, G. / Roussel, J.-M. / Lesage, J.-J. / Bobbio, A. et al. | 2010
- 262
-
IEEE Transactions on Reliability Information for authors| 2010
- 264
-
Information for Authors| 2010
- 264
-
TR Upcoming Events| 2010
- C1
-
Table of contents| 2010
- C2
-
IEEE Transactions on Reliability publication information| 2010
- C3
-
IEEE Transactions on Reliability institutional listings| 2010