A New Efficient Algorithm for Generating All Minimal Tie-Sets Connecting Selected Nodes in a Mesh-Structured Network (English)
- New search for: Cho, J-H
- New search for: Cho, J-H
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- New search for: Feng, P-G
In:
IEEE transactions on reliability
;
59
, 1
; 203-212
;
2010
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ISSN:
- Article (Journal) / Print
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Title:A New Efficient Algorithm for Generating All Minimal Tie-Sets Connecting Selected Nodes in a Mesh-Structured Network
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Contributors:
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Published in:IEEE transactions on reliability ; 59, 1 ; 203-212
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Place of publication:New York, NY
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Publication date:2010
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 85.35 / 50.16
- Further information on Basic classification
- New search for: 770/4575/5670
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Keywords:
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Classification:
BKL: 85.35 Fertigung / 50.16 Technische Zuverlässigkeit, Instandhaltung Local classification TIB: 770/4575/5670 -
Source:
Table of contents – Volume 59, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Extended Best Papers From the 2008 Asian International Workshop on Advanced Reliability Modeling - Spare Routing Reliability for a Stochastic Flow Network Through Two Minimal Paths Under Budget ConstraintPeng, C-Y et al. | 2010
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Spare Routing Reliability for a Stochastic Flow Network Through Two Minimal Paths Under Budget ConstraintYi-Kuei Lin, et al. | 2010
- 11
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Useful Lifetime Prediction of Rubber Components Using Accelerated TestingChang Su Woo, / Sung Seen Choi, / Seong Beom Lee, / Hyun Sub Kim, et al. | 2010
- 18
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Availability Analysis of an Intrusion Tolerant Distributed Server System With Preventive MaintenanceUemura, T. / Dohi, T. / Kaio, N. et al. | 2010
- 30
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Progressive-Stress Accelerated Degradation Test for Highly-Reliable ProductsChien-Yu Peng, / Sheng-Tsaing Tseng, et al. | 2010
- 38
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Nonparametric Estimation of Decreasing Mean Residual Life With Type II Censored DataYan Shen, / Min Xie, / Loon Ching Tang, et al. | 2010
- 45
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Evaluating the Reliability Function and the Mean Residual Life for Equipment With Unobservable StatesGhasemi, A. / Yacout, S. / Ouali, M.-S. et al. | 2010
- 45
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Lifetime Data Analysis - Evaluating the Reliability Function and the Mean Residual Life for Equipment With Unobservable StatesPark, J J et al. | 2010
- 55
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Mean Residual Life Function, Associated Orderings and PropertiesNanda, A.K. / Bhattacharjee, S. / Balakrishnan, N. et al. | 2010
- 66
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Higher Order Equilibrium Life DistributionsAhmad, I.A. / Mugdadi, A.R. et al. | 2010
- 74
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Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation TestsJong In Park, / Suk Joo Bae, et al. | 2010
- 91
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A Practical Application of Quantitative Accelerated Life Testing in Power Systems EngineeringTurner, M.D. et al. | 2010
- 91
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Accelerated Testing - A Practical Application of Quantitative Accelerated Life Testing in Power Systems EngineeringGera, A E et al. | 2010
- 102
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Accelerated Degradation Tests Applied to Software Aging ExperimentsMatias, R. / Barbetta, P.A. / Trivedi, K.S. / Filho, P.J.F. et al. | 2010
- 115
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Accelerated Life Test Plans for Repairable Systems With Multiple Independent RisksXiao Liu, / Long-Ching Tang, et al. | 2010
- 128
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A New Start-Up Demonstration TestGera, A.E. et al. | 2010
- 128
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Demonstration Testing - A New Start-Up Demonstration TestShrestha, A et al. | 2010
- 132
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Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic DevicesTao Yuan, / Yue Kuo, et al. | 2010
- 132
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Burn-In - Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic DevicesGottumukkala, N R et al. | 2010
- 139
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Assessing 2-Dimensional Nanocomponent's Limiting ReliabilityEbrahimi, N. et al. | 2010
- 139
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Nanocomponents - Assessing 2-Dimensional Nanocomponent's Limiting ReliabilityLi, G-D et al. | 2010
- 145
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Systems - Decision Diagram Based Methods and Complexity Analysis for Multi-State SystemsEryilmaz, S et al. | 2010
- 145
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Decision Diagram Based Methods and Complexity Analysis for Multi-State SystemsShrestha, A. / Liudong Xing, / Yuanshun Dai, et al. | 2010
- 162
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Reliability of a System of k Nodes for High Performance Computing ApplicationsGottumukkala, N.R. / Nassar, R. / Paun, M. / Leangsuksun, C.B. / Scott, S.L. et al. | 2010
- 170
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A New Reliability Prediction Model in Manufacturing SystemsGuo-Dong Li, / Masuda, S. / Yamaguchi, D. / Nagai, M. et al. | 2010
- 178
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Conditional Lifetimes of Consecutive $k$-Out-of- $n$ SystemsEryilmaz, S. et al. | 2010
- 178
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Conditional Lifetimes of Consecutive Formula Not Shown -Out-of- Formula Not Shown SystemsEryilmaz, S. et al. | 2010
- 183
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Networks - Reliability of k Separate Minimal Paths Under Both Time and Budget ConstraintsYeh, W-C et al. | 2010
- 183
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Reliability of Formula Not Shown Separate Minimal Paths Under Both Time and Budget ConstraintsLin, Y. K. et al. | 2010
- 183
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Reliability of $k$ Separate Minimal Paths Under Both Time and Budget ConstraintsYi-Kuei Lin, et al. | 2010
- 191
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Modeling Link Events in High Reliability Networks With Support Vector MachinesFeijoo, J. / Rojo-Alvarez, J.L. / Sueiro, J.C. / Conde-Pardo, P. / Mata-Vigil-Escalera, J.L. et al. | 2010
- 203
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A New Efficient Algorithm for Generating All Minimal Tie-Sets Connecting Selected Nodes in a Mesh-Structured NetworkMalinowski, J. et al. | 2010
- 212
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A Particle Swarm Optimization Approach Based on Monte Carlo Simulation for Solving the Complex Network Reliability ProblemWei-Chang Yeh, / Yi-Cheng Lin, / Yuk Ying Chung, / Mingchang Chih, et al. | 2010
- 222
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A Genetic Programming Approach for Software Reliability ModelingCosta, E.O. / Pozo, A. / Vergilio, S.R. et al. | 2010
- 222
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Software Reliability - A Genetic Programming Approach for Software Reliability ModelingMerle, G et al. | 2010
- 231
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Security - Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc Networks| 2010
- 231
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Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc NetworksJin-Hee Cho, / Ing-Ray Chen, / Phu-Gui Feng, et al. | 2010
- 242
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Maintenance - Linear and Nonlinear Preventive Maintenance ModelsLange, Barbara H et al. | 2010
- 242
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Linear and Nonlinear Preventive Maintenance ModelsShaomin Wu, / Zuo, M.J. et al. | 2010
- 250
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Fault Trees - Probabilistic Algebraic Analysis of Fault Trees With Priority Dynamic Gates and Repeated Events| 2010
- 250
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Probabilistic Algebraic Analysis of Fault Trees With Priority Dynamic Gates and Repeated EventsMerle, G. / Roussel, J.-M. / Lesage, J.-J. / Bobbio, A. et al. | 2010
- 262
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IEEE Transactions on Reliability Information for authors| 2010
- 264
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Information for Authors| 2010
- 264
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TR Upcoming Events| 2010
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Table of contents| 2010
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IEEE Transactions on Reliability publication information| 2010
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