Aspect ratio dependent strains in InAs/InP quantum dots measured by synchrotron radiation x-ray diffraction (English)
- New search for: Kim, Kihong
- New search for: Yoon, Sukho
- New search for: Yoon, Euijoon
- New search for: Koo, Yang Mo
- New search for: Lee, Jong-Lam
- New search for: Kim, Kihong
- New search for: Yoon, Sukho
- New search for: Yoon, Euijoon
- New search for: Koo, Yang Mo
- New search for: Lee, Jong-Lam
In:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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21
, 1
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183-185
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2003
- Article (Journal) / Electronic Resource
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Title:Aspect ratio dependent strains in InAs/InP quantum dots measured by synchrotron radiation x-ray diffraction
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Contributors:Kim, Kihong ( author ) / Yoon, Sukho ( author ) / Yoon, Euijoon ( author ) / Koo, Yang Mo ( author ) / Lee, Jong-Lam ( author )
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Published in:
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Publisher:
- New search for: American Vacuum Society
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Publication date:2003-01-01
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Size:3 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 21, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Fabrication of Si single-electron transistors with precise dimensions by electron-beam nanolithographyNamatsu, H. / Watanabe, Y. / Yamazaki, K. / Yamaguchi, T. / Nagase, M. / Ono, Y. / Fujiwara, A. / Horiguchi, S. et al. | 2003
- 6
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Application of electron-beam lithography in manufacturing of magnetic headsKurokawa, Masaki / Yamada, Akio et al. | 2003
- 11
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Physical and electrical properties of metal gate electrodes on gate dielectricsSchaeffer, J. K. / Samavedam, S. B. / Gilmer, D. C. / Dhandapani, V. / Tobin, P. J. / Mogab, J. / Nguyen, B.-Y. / White, B. E. / Dakshina-Murthy, S. / Rai, R. S. et al. | 2003
- 18
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Scanning tunneling microscopy images of III–V semiconductor alloys: Strain effectsMcKay, H. A. / Chen, Huajie / Feenstra, R. M. / Poole, P. J. et al. | 2003
- 23
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Controlled growth of periodic pillars by glancing angle depositionDick, B. / Brett, M. J. / Smy, T. et al. | 2003
- 29
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Growth-temperature dependence of the microstructure of ErAs islands in GaAsKadow, C. / Johnson, J. A. / Kolstad, K. / Gossard, A. C. et al. | 2003
- 33
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Investigation of various copper seed layers for copper electrodeposition applicable to ultralarge-scale integration interconnectionKim, Jae Jeong / Kim, Soo-Kil / Lee, Chang Hwa / Kim, Yong Shik et al. | 2003
- 39
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Lifetime estimation of ac plasma display panels from the quantitative investigation of MgO-layer erosion based on microscopic in situ transmission measurementChoi, Seungho / Byun, Hyun Suk / Shin, Gil Yong / Oh, Soo-ghee / Lee, Soonil et al. | 2003
- 43
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Development of a cold-cathode electron gun for cathode-ray tube using a Mo-tip field-emitter arrayKim, Hoon / Seo, Sang-Won / Park, Jong-Won / Lee, Yun-Hi / Jang, Jin / Ju, Byeong-Kwon et al. | 2003
- 48
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Fabrication and properties of piezoresistive cantilever beam with porous silicon elementDomanski, K. / Grabiec, P. / Marczewski, J. / Gotszalk, T. / Ivanov, Tz. / Abedinov, N. / Rangelow, I. W. et al. | 2003
- 53
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Ultraviolet-Raman studies of ultrathin films on SiHilt Tisinger, L. / Liu, R. / Kulik, J. / Zhang, X. / Ramdani, J. / Demkov, A. A. et al. | 2003
- 57
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Complementary masking approach for proximity electron lithographyOmori, S. / Iwase, K. / Amai, K. / Sasaki, T. / Hane, H. / Koike, K. / Nohama, S. / Ashida, I. / Kitagawa, T. / Moriya, S. et al. | 2003
- 61
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Stripping of photoresist using a remote thermal and plasmaBrussaard, G. J. H. / Letourneur, K. G. Y. / Schaepkens, M. / van de Sanden, M. C. M. / Schram, D. C. et al. | 2003
- 67
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Simultaneous surface topography and spin-injection probabilityBullock, D. W. / LaBella, V. P. / Ding, Z. / Thibado, P. M. et al. | 2003
- 71
-
Chemical and structural characterization of GaSb(100) surfaces treated by HCl-based solutions and annealed in vacuumLiu, Z. Y. / Hawkins, B. / Kuech, T. F. et al. | 2003
- 78
-
Large-area patterning of nm structures on flexible substrates using near-field 193 nm radiationKunz, R. R. / Rothschild, M. / Yeung, M. S. et al. | 2003
- 82
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Study on dc characteristics of an interesting InP/InGaAs tunneling-emitter bipolar transistor with double heterostructuresChen, Chun-Yuan / Chiou, Wen-Huei / Yen, Chih-Hung / Chuang, Hung-Ming / Chen, Jing-Yuh / Cheng, Chin-Chuan / Liu, Wen-Chau et al. | 2003
- 87
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Microstructural study of Pt contact on p-type GaNKim, Jong Kyu / Jang, Ho Won / Kim, Chong Cook / Je, Jung Ho / Rickert, Kimberly A. / Kuech, Thomas F. / Lee, Jong-Lam et al. | 2003
- 91
-
Efficient removers for poly(methylmethacrylate)Hang, Qingling / Hill, Davide A. / Bernstein, Gary H. et al. | 2003
- 98
-
Influence of pattern density in nanoimprint lithographyGourgon, C. / Perret, C. / Micouin, G. / Lazzarino, F. / Tortai, J. H. / Joubert, O. / Grolier, J.-P. E. et al. | 2003
- 106
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Transient measurement of resist charging during electron beam exposureBai, Min / Meisburger, W. Dan / Pease, R. Fabian W. et al. | 2003
- 112
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Line edge roughness and photoresist percolation development modelMa, Yuansheng / Shin, J. / Cerrina, Franco et al. | 2003
- 118
-
Fabrication of subwavelength-size aperture for a near-field optical probe using various microfabrication proceduresChoi, S. S. / Jung, M. Y. / Kim, D. W. / Kim, J. W. / Boo, J. H. et al. | 2003
- 123
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Thermal emissivity of carbon coated p-doped silicon stencil masks for ion projection lithographyBraun, D. / Gajic, R. / Kuchar, F. / Korntner, R. / Haugeneder, E. / Loeschner, H. / Butschke, J. / Letzkus, F. / Springer, R. et al. | 2003
- 127
-
Thermal and structural deformation and its impact on optical performance of projection optics for extreme ultraviolet lithographyLi, Yanqiu / Ota, Kazuya / Murakami, Katsuhiko et al. | 2003
- 130
-
Electromagnetic characterization of nanoimprint mold inspectionDeng, Yunfei / Neureuther, Andrew R. et al. | 2003
- 135
-
Measurement of resist response to heatingBabin, Sergey et al. | 2003
- 141
-
Photoresist etch resistance enhancement using novel polycarbocyclic derivatives as additivesGogolides, Evangelos / Argitis, Panagiotis / Couladouros, Elias A. / Vidali, Veroniki P. / Vasilopoulou, Maria / Cordoyiannis, George / Diakoumakos, Constantinos D. / Tserepi, Angeliki et al. | 2003
- 148
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Passivation of InP surfaces of electronic devices by organothiolated self-assembled monolayersSchvartzman, M. / Sidorov, V. / Ritter, D. / Paz, Y. et al. | 2003
- 156
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Soluble site density model for negative and positive chemically amplified resistsOcola, L. E. et al. | 2003
- 162
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Fabrication of mesoscopic devices using atomic force macroscopic electric field induced oxidationLee, F. K. / Wen, G. H. / Zhang, X. X. / Tsui, O. K. C. et al. | 2003
- 168
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Microstructure and crystallinity of porous silicon and epitaxial silicon layers fabricated on porous siliconLiu, Weili / Xie, Xinying / Zhang, Miao / Shen, Qinwo / Lin, Chenglu / Wang, Lumin / Chu, Paul K. et al. | 2003
- 174
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Etching behavior of Si-containing polymers as resist materials for bilayer lithography: The case of poly-dimethyl siloxaneTserepi, A. / Cordoyiannis, G. / Patsis, G. P. / Constantoudis, V. / Gogolides, E. / Valamontes, E. S. / Eon, D. / Peignon, M. C. / Cartry, G. / Cardinaud, Ch. et al. | 2003
- 183
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Aspect ratio dependent strains in InAs/InP quantum dots measured by synchrotron radiation x-ray diffractionKim, Kihong / Yoon, Sukho / Yoon, Euijoon / Koo, Yang Mo / Lee, Jong-Lam et al. | 2003
- 186
-
Enhancement of emission characteristics for field-emitter arrays by optimizing the etched feature of the gate electrodeKim, Hoon / Seo, Sang-Won / Lee, Joo-Won / Park, Jong-Won / Lee, Yun-Hi / Jang, Jin / Ju, Byeong-Kwon et al. | 2003
- 193
-
Investigation of boron penetration through decoupled plasma nitrided gate oxide using backside secondary ion mass spectrometry depth profilingYeo, K. L. / Wee, A. T. S. / Liu, R. / Zhou, F. F. / See, A. et al. | 2003
- 198
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Towards a better understanding of the operative mechanisms underlying impurity-free disordering of GaAs: Effect of stressDoshi, Sachin / Deenapanray, Prakash N. K. / Tan, H. H. / Jagadish, C. et al. | 2003
- 204
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Direct writing of photomask by ultrashort laserStanley, P. / Venkatakrishnan, K. / Lim, L. E. N. et al. | 2003
- 207
-
Fabrication of high resolution x-ray masks using diamond membrane for second generation x-ray lithographyMarumoto, Kenji / Yabe, Hideki / Aya, Sunao / Kise, Koji / Ami, Shigeto / Sasaki, Kei / Watanabe, Hiroshi / Itoga, Kenji / Sumitani, Hiroaki et al. | 2003
- 214
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Diffractive x-ray optics using production fabrication methodsStein, A. / Jacobsen, C. / Evans-Lutterodt, K. / Tennant, D. M. / Bogart, G. / Klemens, F. / Ocola, L. E. / Choi, B. J. / Sreenivasan, S. V. et al. | 2003
- 220
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Diffusion barrier integrity evaluation by ellipsometric porosimetryShamiryan, D. / Baklanov, M. R. / Maex, K. et al. | 2003
- 227
-
Selective deposition of molecules through poly(methylmethacrylate) patterns defined by electron-beam lithographyHang, Qingling / Wang, Yuliang / Lieberman, Marya / Bernstein, Gary H. et al. | 2003
- 233
-
Protective layer using plasma polymerized thin films in ac-plasma display panelKim, Sung-O et al. | 2003
- 237
-
Formation of low resistivity alpha Ta by ion beam sputteringZhang, Jinqiu / Huai, Yiming / Chen, Lifan / Zhang, Jing et al. | 2003
- 241
-
Bonding and band offset in -grown oxynitrideGritsenko, V. A. / Wong, Hei / Kwok, W. M. / Xu, J. B. et al. | 2003
- 246
-
Growth temperature dependence of substitutional carbon incorporation in SiGeC/Si heterostructuresLoup, V. / Hartmann, J. M. / Rolland, G. / Holliger, P. / Laugier, F. / Séméria, M. N. et al. | 2003
- 254
-
Monte Carlo simulation of gel formation and surface and line-edge roughness in negative tone chemically amplified resistsPatsis, G. P. / Glezos, N. / Gogolides, E. et al. | 2003
- 267
-
Profile control of high aspect ratio trenches of silicon. II. Study of the mechanisms responsible for local bowing formation and elimination of this effectBoufnichel, M. / Aachboun, S. / Lefaucheux, P. / Ranson, P. et al. | 2003
- 274
-
Thick and thermally isolated Si microheaters for microfabricated preconcentratorsTian, W.-C. / Pang, S. W. et al. | 2003
- 280
-
High-power collimated laser-plasma source for proximity x-ray nanolithographyGaeta, C. J. / Rieger, H. / Turcu, I. C. E. / Forber, R. A. / Campeau, S. M. / Cassidy, K. L. / Powers, M. F. / Stone, A. / Maldonado, J. R. / Mrowka, S. et al. | 2003
- 288
-
Influence of seed layers on microstructure and electrical properties of indium-tin oxide filmsHan, Younggun / Kim, Donghwan / Cho, Jun-Sik / Koh, Seok-Keun et al. | 2003
- 293
-
Ta metallization of Si–O–C substrate and Cu metallization of Ta/Si–O–C multilayerTong, J. / Martini, D. / Magtoto, N. / Kelber, J. et al. | 2003
- 301
-
Adaptive run-to-run control and monitoring for a rapid thermal processorQin, S. Joe / Scheid, Glen W. / Riley, Terrence J. et al. | 2003
- 311
-
Completion of the β tool and the recent progress of low energy e-beam proximity projection lithographyEndo, Akihiro / Higuchi, Akira / Nozue, Hiroshi / Shimazu, Nobuo / Fukui, Toyoji / Yasumitsu, Naoki / Miyatake, Tsutomu / Anazawa, Norimichi et al. | 2003
- 316
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Fabrication of nanocrystalline aluminium islands using double-surface anodizationBooth, S. E. / Marsh, C. D. / Mallik, Kanad / Baranauskas, V. / Sykes, J. M. / Wilshaw, P. R. et al. | 2003
- 319
-
Improved thermal stability of Ni silicide on Si (100) through reactive deposition of NiKim, Gi Bum / Yoo, Do-Joon / Baik, Hong Koo / Myoung, Jae-Min / Lee, Sung Man / Oh, Sang Ho / Park, Chan Gyung et al. | 2003
- 323
-
Atomic force microscopy of nickel dot arrays with tuning fork and nanotube probeRozhok, S. / Jung, S. / Chandrasekhar, V. / Lin, Xiwei / Dravid, Vinayak P. et al. | 2003
- 326
-
Electrical investigation on low-pressure chemical-vapor-deposited and thermal-processed Si/SiGe on a SIMOX substrateFujinaga, Kiyohisa et al. | 2003
- 329
-
Deposition of layers on 4H–SiC by photochemical vapor depositionChiou, Yu-Zung / Chang, Chia-Sheng / Chang, Shoou-Jinn / Su, Yan-Kuin / Chiou, Jung-Ran / Huang, Bohr-Ran / Chen, Jone F. et al. | 2003
- 332
-
Fabrication of air bridges using electron beam lithographyGritz, Michael A. / Metzler, Meredith / Moser, Joel / Spencer, David / Boreman, Glenn D. et al. | 2003
- 338
-
Field emission vacuum power switch using vertically aligned carbon nanotubesRupesinghe, N. L. / Chhowalla, M. / Teo, K. B. K. / Amaratunga, G. A. J. et al. | 2003
- 344
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Characterization of electron emitters for miniature x-ray sourcesBusta, H. H. / Chen, J. M. / Shen, Z. / Jansen, K. / Rizkowski, S. / Matey, J. / Lanzillotto, A. et al. | 2003
- 350
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High-resolution retarding field analyzerJohnson, S. D. / El-Gomati, M. M. / Enloe, L. et al. | 2003
- 354
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Electron gun with field emission cathode of carbon fiber bundleBaturin, A. S. / Yeskin, I. N. / Trufanov, A. I. / Chadaev, N. N. / Sheshin, E. P. / Tchesov, R. G. et al. | 2003
- 358
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Field emission characteristics of self-assembled carbon nanotubes on the gold surfaceLee, J. H. / Heo, J. N. / Yi, W. K. / Jeong, T. W. / Yu, SeGi / Lee, C. S. / Kim, W. S. / Yoo, J.-B. / Han, H. S. / Kim, J. M. et al. | 2003
- 362
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Emission site control in carbon nanotube field emitters by focused ion and laser irradiationSawada, A. / Iriguchi, M. / Zhao, W. J. / Ochiai, C. / Takai, M. et al. | 2003
- 366
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Modeling of field emission nanotriodes with carbon nanotube emittersNicolaescu, D. / Filip, V. / Kanemaru, S. / Itoh, J. et al. | 2003
- 375
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Development of triode-type carbon nanotube field-emitter arrays with suppression of diode emission by forming electroplated Ni wall structureJung, J. E. / Choi, J. H. / Park, Y. J. / Lee, H. W. / Jin, Y. W. / Chung, D. S. / Park, S. H. / Jang, J. E. / Hwang, S. Y. / Ko, T. Y. et al. | 2003
- 382
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Influence of the electronic structure on the field electron emission from carbon nanotubesFilip, V. / Nicolaescu, D. / Tanemura, M. / Okuyama, F. et al. | 2003
- 391
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Field emitter using multiwalled carbon nanotubes grown on the silicon tip region by microwave plasma-enhanced chemical vapor depositionWong, Y. M. / Kang, W. P. / Davidson, J. L. / Wisitsora-at, A. / Soh, K. L. / Fisher, T. / Li, Q. / Xu, J. F. et al. | 2003
- 395
-
Three-dimensional simulations of field emission through an oscillating barrier from a (10,0) carbon nanotubeMayer, A. / Miskovsky, N. M. / Cutler, P. H. et al. | 2003
- 400
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Effect of catalyst on growth behavior of carbon nanotubes synthesized by microwave heating thermal chemical vapor deposition processCheng, Hsiu-Fung / Chuo, Yen / Chou, Chen-Shien / Huang, Jin-Hua / Liu, Kuo-Shung / Lin, I-Nan et al. | 2003
- 406
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Field emission from nanocompositesLerner, Peter / Miskovsky, N. M. / Cutler, P. H. / Chung, Moon S. et al. | 2003
- 412
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Emission statistics and the characterization of array currentJensen, Kevin L. / Marrese-Reading, Colleen M. et al. | 2003
- 418
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Dependence of field emission from on the stoichiometric composition forChung, M. S. / Cutler, P. H. / Miskovsky, N. M. et al. | 2003
- 422
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Emission characteristics of NbC/Nb field emitter array cathodesMackie, W. A. / Southall, L. A. / Xie, Tianbao / Cabe, G. L. / McClelland, P. H. et al. | 2003
- 427
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Uniformity and stability of field emission from bare and metal coated Si tip arraysGünther, B. / Kaldasch, F. / Müller, G. / Schmitt, S. / Henning, T. / Huber, R. / Lacher, M. et al. | 2003
- 433
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Spindt cathode tip processing to enhance emission stability and high-current performanceSchwoebel, P. R. / Spindt, C. A. / Holland, C. E. et al. | 2003
- 436
-
Emission stability of a field emitter array observed by an emission microscopeMiyamoto, Nobuo / Adachi, Hiroshi / Nakane, Hideaki / Yamane, Khoichi et al. | 2003
- 440
-
Electrical aging of molybdenum field emittersLee, Jong Duk / Oh, Chang Woo / Park, Byung Gook et al. | 2003
- 445
-
Field emission characteristics of GaN roughened with plasmaKimura, Chiharu / Yamamoto, Tomohide / Sugino, Takashi et al. | 2003
- 449
-
Low-field electron emission of Si microtip arrays produced by laser beam evaporationKarabutov, A. V. / Frolov, V. D. / Simakin, A. V. / Shafeev, G. A. et al. | 2003
- 453
-
Effect of annealing temperature on the electron emission characteristics of silicon tips coated with thin filmKang, W. P. / Wisitsora-at, A. / Davidson, J. L. / Tan, O. K. / Zhu, W. G. / Li, Q. / Xu, J. F. et al. | 2003
- 458
-
Field emission characterization of silicon tip arrays coated with GaN and diamond nanoparticle clustersHajra, M. / Chubun, N. N. / Chakhovskoi, A. G. / Hunt, C. E. / Liu, K. / Murali, A. / Risbud, S. H. / Tyler, T. / Zhirnov, V. et al. | 2003
- 464
-
Low leakage current optically gated silicon field emitter arraysLiu, Kendrick X. / Heritage, Jonathan P. et al. | 2003
- 471
-
Emission characteristics of a GaAs wedge emitter monolithically fabricated with an air bridge and a cantilever anodeMimura, H. / Yilmazoglu, O. / Shimawaki, H. / Yokoo, K. / Mutamba, K. / Hartnagel, H. et al. | 2003
- 474
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Behavior of the solid-state field-controlled planar emitters under extreme working conditionsBinh, Vu Thien / Semet, V. / Dupin, J. P. / Adessi, Ch. / Guillot, D. et al. | 2003
- 479
-
Overview of field-emission information storage devicesLam, Si-Ty et al. | 2003
- 483
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Field-emission characterization of the singly addressable double-gated polysilicon tip arrayChubun, N. N. / Chakhovskoi, A. G. / Hajra, M. / Hunt, C. E. et al. | 2003
- 486
-
Double-gated silicon field emittersDvorson, L. / Kymissis, I. / Akinwande, A. I. et al. | 2003
- 495
-
Metal–oxide–semiconductor field-effect transistor-structured Si field emitter array with a built-in ring gate lensNagao, M. / Nicolaescu, D. / Matsukawa, T. / Kanemaru, S. / Itoh, J. / Sato, T. / Sato, Y. / Wada, N. et al. | 2003
- 500
-
Silicon metal–oxide–semiconductor field effect transistor/field emission array fabricated using chemical mechanical polishingHong, Ching-yin / Akinwande, Akintunde I. et al. | 2003
- 506
-
Lateral field emitter arrays with high emission currents and wide operation region by high field activationLee, Jae-Hoon / Lee, Myoung-Bok / Hahm, Sung-Ho / Lee, Jung-Hee / Seo, Hwa-Il / Kwon, Dae-Hyuk / Kim, Jin-Sup / Choi, Kyu-Man et al. | 2003
- 511
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Electrical behavior of field-emission device with C-based surface layerLee, Myoung-Bok / Kwon, Ki-Rock / Lee, Jae-Hoon / Hahm, Sung-Ho / Lee, Jung-Hee et al. | 2003
- 515
-
Blue-emitting ZnS:Ag,Al phosphors with low defect density for high-voltage field-emission displaysKajiwara, K. / Hida, T. / Tanaka, K. et al. | 2003
- 519
-
Metal–oxide–semiconductor field effect transistor-controlled field emission displayKim, Il Hwan / Lee, Jong Duk / Oh, Chang Woo / Park, Jae Woo / Park, Byung Gook et al. | 2003
- 523
-
Study of a microprocessor-based technique for improving the uniformity of a field-emission flat-panel displayDeng, S. Z. / Wang, K. / Chen, Jun / Zhang, Y. Q. / Xu, N. S. et al. | 2003
- 527
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Degradation behavior of low-voltage cathodoluminescence of a ZnS:Ag,CI phosphor screen under a panel sealing environmentPark, Z. M. / Jeon, D. Y. / Jin, Y. W. / Cha, S. N. / Kim, J. M. et al. | 2003
- 532
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Preparation and characterization of phosphor synthesized with an optimized combustion processKim, Jin Young / Kang, Jong Hyuk / Lee, Dong Chin / Jeon, Duk Young et al. | 2003
- 536
-
Investigation of the characteristic changes on phosphors during low voltage electron irradiationKim, Jin Young / You, Yong Chan / Jeon, Duk Young / Yu, Il / Yang, Hong-Gun et al. | 2003
- 540
-
GaN planar-doped-barrier electron emitter with piezoelectric surface barrier loweringShen, L. / Smochkova, I. P. / Green, D. S. / Heikman, S. / Mishra, U. K. et al. | 2003
- 544
-
Improved field-emission characteristics of GaN by BN coatingKimura, Chiharu / Yamamoto, Tomohide / Sugino, Takashi et al. | 2003
- 548
-
Analysis of the slope of the Fowler–Nordheim plot for field emission from -type semiconductorsChung, M. S. / Yoon, B.-G. et al. | 2003
- 552
-
Field emission from metal particles bound with a photoresistBaba, Akiyoshi / Asano, Tanemasa et al. | 2003
- 557
-
Field-emission characteristics of carbon buckypaperKnapp, W. / Schleussner, D. et al. | 2003
- 562
-
Growth and evaluation of nanostructured carbon films for triode field emitter applicationPark, Kyung Ho / Han, Hyung Jun / Choi, Seungho / Lee, Kyung Moon / Lee, Soonil / Koh, Ken Ha et al. | 2003
- 567
-
Analysis of the field-electron energy distribution from amorphous carbon-nitride filmsChen, Jun / Huang, N. Y. / Liu, X. W. / Deng, S. Z. / Xu, N. S. et al. | 2003
- 571
-
Reticulated vitreous carbon field emission cathodes for light source applicationsChakhovskoi, Andrei G. / Hunt, Charles E. / Forsberg, Gunnar / Nilsson, Thomas / Persson, Per et al. | 2003
- 576
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Variations in structure and emission characteristics of nanostructured carbon films prepared by the hot-filament chemical-vapor-deposition method due to the addition of ammonia in the sourceChoi, Seungho / Park, Kyung Ho / Han, Hyung Jun / Lee, Kyung Moon / Lee, Soonil / Koh, Ken Ha et al. | 2003
- 581
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Effects of the interface and surface nanostructures on field emission of amorphous diamond filmChen, Jian / Xu, N. S. / Deng, S. Z. / She, J. C. / Chen, Jun et al. | 2003
- 587
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High-temperature electron emission from diamond filmsShin, S. H. / Fisher, T. S. / Walker, D. G. / Strauss, A. M. / Kang, W. P. / Davidson, J. L. et al. | 2003
- 593
-
Fabrication and field emission characteristics of lateral diamond field emitterKang, W. P. / Davidson, J. L. / Wisitsora-at, A. / Howell, M. / Jamaludin, A. / Wong, Y. M. / Soh, K. L. / Kerns, D. V. et al. | 2003
- 597
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Dielectric-carbon composites for field electron emittersKarabutov, A. V. / Ralchenko, V. G. / Vlasov, I. I. / Gordeev, S. K. / Korchagina, S. B. et al. | 2003
- 603
-
Field emission properties of phosphorus doped microwave plasma chemical vapor deposition diamond films by ion implantationCho, Euo Sik / Park, Byung-Gook / Lee, Jong Duk / Kwon, Sang Jik et al. | 2003
- 608
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Current image tunneling spectroscopy of chemical vapor deposited diamond filmsLin, I-Nan / Chou, Yi-Ping / Chen, Tong T. / Cheng, Hsiu-Fung et al. | 2003
- 614
-
Diamond field-emission triode with low gate turn-on voltage and high gainWisitsora-at, A. / Kang, W. P. / Davidson, J. L. / Kerns, D. V. / Fisher, T. et al. | 2003
- 618
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Influence of the optimal etching conditions of silicon substrates on field-electron emission from amorphous-diamond filmsChen, Jian / Xu, N. S. / She, J. C. / Chen, Jun / Deng, S. Z. et al. | 2003
- 623
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Effects of metal buffer layers on the hot filament chemical vapor deposition of nanostructured carbon filmsLee, Kyung Moon / Han, Hyung Jun / Choi, Seungho / Park, Kyung Ho / Oh, Soo-ghee / Lee, Soonil / Koh, Ken Ha et al. | 2003
- 627
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Silicon doped diamond-like carbon films as a coating for improvement of electron field emissionEvtukh, Anatoli A. / Litovchenko, Volodimir G. / Litvin, Yurii M. / Fedin, Dmitrii V. / Dzyan, Olexander S. / Pedchenko, Yu. N. / Chakhovskoi, Andrei G. / Felter, Thomas E. et al. | 2003