To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction (English)
- New search for: Sojka, Falko
- New search for: Meissner, Matthias
- New search for: Zwick, Christian
- New search for: Forker, Roman
- New search for: Vyshnepolsky, Michael
- New search for: Klein, Claudius
- New search for: Horn-von Hoegen, Michael
- New search for: Fritz, Torsten
- New search for: Sojka, Falko
- New search for: Meissner, Matthias
- New search for: Zwick, Christian
- New search for: Forker, Roman
- New search for: Vyshnepolsky, Michael
- New search for: Klein, Claudius
- New search for: Horn-von Hoegen, Michael
- New search for: Fritz, Torsten
In:
Ultramicroscopy
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133
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35-40
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2013
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ISSN:
- Article (Journal) / Electronic Resource
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Title:To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction
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Contributors:Sojka, Falko ( author ) / Meissner, Matthias ( author ) / Zwick, Christian ( author ) / Forker, Roman ( author ) / Vyshnepolsky, Michael ( author ) / Klein, Claudius ( author ) / Horn-von Hoegen, Michael ( author ) / Fritz, Torsten ( author )
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Published in:Ultramicroscopy ; 133 ; 35-40
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Publisher:
- New search for: Elsevier B.V.
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Publication date:2013-04-21
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Size:6 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 133
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Ranking TEM cameras by their response to electron shot noiseGrob, Patricia / Bean, Derek / Typke, Dieter / Li, Xueming / Nogales, Eva / Glaeser, Robert M. et al. | 2013
- 8
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Estimations of bulk geometrically necessary dislocation density using high resolution EBSDRuggles, T.J. / Fullwood, D.T. et al. | 2013
- 16
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Boundary identification in EBSD data with a generalization of fast multiscale clusteringMcMahon, Cullen / Soe, Brian / Loeb, Andrew / Vemulkar, Ayyappa / Ferry, Michael / Bassman, Lori et al. | 2013
- 26
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Recording low and high spatial frequencies in exit wave reconstructionsHaigh, S.J. / Jiang, B. / Alloyeau, D. / Kisielowski, C. / Kirkland, A.I. et al. | 2013
- 35
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To tilt or not to tilt: Correction of the distortion caused by inclined sample surfaces in low-energy electron diffractionSojka, Falko / Meissner, Matthias / Zwick, Christian / Forker, Roman / Vyshnepolsky, Michael / Klein, Claudius / Horn-von Hoegen, Michael / Fritz, Torsten et al. | 2013
- 41
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Imaging of Au nanoparticles deeply buried in polymer matrix by various atomic force microscopy techniquesKimura, Kuniko / Kobayashi, Kei / Matsushige, Kazumi / Yamada, Hirofumi et al. | 2013
- 50
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An alternative approach to determine attainable resolution directly from HREM imagesWang, A. / Turner, S. / Van Aert, S. / Van Dyck, D. et al. | 2013
- 62
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Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition of platinumBrown, Jason / Kocher, Paul / Ramanujan, Chandra S / Sharp, David N / Torimitsu, Keiichi / Ryan, John F et al. | 2013
- 67
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Apparent increase in the thickness of superconducting particles at low temperatures measured by electron holographyHirsch, J.E. et al. | 2013
- 72
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Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopyVendelbo, S.B. / Kooyman, P.J. / Creemer, J.F. / Morana, B. / Mele, L. / Dona, P. / Nelissen, B.J. / Helveg, S. et al. | 2013
- 80
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Thermal mapping of a scanning thermal microscopy tipJóźwiak, Grzegorz / Wielgoszewski, Grzegorz / Gotszalk, Teodor / Kępiński, Leszek et al. | 2013
- 88
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Development of nanomanipulator using a high-speed atomic force microscope coupled with a haptic deviceIwata, F. / Ohashi, Y. / Ishisaki, I. / Picco, L.M. / Ushiki, T. et al. | 2013
- 95
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Quantifying nanoscale order in amorphous materials via scattering covariance in fluctuation electron microscopyLi, Tian T. / Darmawikarta, Kristof / Abelson, John R. et al. | 2013
- 101
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Numerical simulation of Electron Energy Loss Spectroscopy using a Generalized Multipole TechniqueKiewidt, Lars / Karamehmedović, Mirza / Matyssek, Christian / Hergert, Wolfram / Mädler, Lutz / Wriedt, Thomas et al. | 2013
- 109
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Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM imagesE, H. / MacArthur, K.E. / Pennycook, T.J. / Okunishi, E. / D'Alfonso, A.J. / Lugg, N.R. / Allen, L.J. / Nellist, P.D. et al. | 2013
- 120
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Corrigendum to “Effects of growth pressure on the structural and optical properties of multi quantum wells (MQWs) in blue LED” [Ultramicroscopy 127 (2013) 114–118]Jang, D.H. / Gu, G.H. / Lee, B.H. / Park, C.G. et al. | 2013
- IFC
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IFC (Editorial Board)| 2013