Low-energy electron diffraction study of atomic structure of Sc-O-W(100) surface acting as Schottky emitter at high temperatures (English)
- New search for: Iida, S.
- New search for: Iida, S.
- New search for: Tsujita, T.
- New search for: Nagatomi, T.
- New search for: Takai, Y.
In:
Surface and interface analysis
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35
, 1
; 7-10
;
2003
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ISSN:
- Article (Journal) / Print
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Title:Low-energy electron diffraction study of atomic structure of Sc-O-W(100) surface acting as Schottky emitter at high temperatures
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Contributors:
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Published in:Surface and interface analysis ; 35, 1 ; 7-10
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Publisher:
- New search for: Wiley
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Place of publication:Chichester [u.a.]
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Publication date:2003
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ISSN:
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ZDBID:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 51.00 / 33.68 / 33.68 / 51.00
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- New search for: 020/3485
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Source:
Table of contents – Volume 35, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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PrefaceOshima, Chuhei / Koshikawa, Takanori et al. | 2003
- 2
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Direct observation of growth motion of elements by ultrahigh vacuum scanning electron microscopy combined with total reflection angle x‐ray spectroscopyYamanaka, Toshiro / Shimomura, Naoharu / Ino, Shozo et al. | 2003
- 7
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Low‐energy electron diffraction study of atomic structure of Sc–O/W(100) surface acting as Schottky emitter at high temperaturesIida, S. / Tsujita, T. / Nagatomi, T. / Takai, Y. et al. | 2003
- 11
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Electron emission characteristics of ZrO/W electron sources with a wide range of tip radiiSakawa, Seiichi / Tsunoda, Katsuyoshi / Terui, Yoshinori et al. | 2003
- 15
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Structural characterization of randomly and vertically oriented carbon nanotube films grown by chemical vapour depositionIkuno, Takashi / Furuta, Hiroshi / Yamamoto, Tetsuro / Takahashi, Syunji / Kamizono, Motoki / Honda, Shin‐ichi / Katayama, Mitsuhiro / Hirao, Takashi / Oura, Kenjiro et al. | 2003
- 19
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High‐resolution AES study of Ar+‐irradiated graphiteHashimoto, Hiroyuki / Watanabe, Masatoshi / Nishiuma, Satoru / Nakamura, Kumi / Yoshida, Shigeki et al. | 2003
- 24
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Copper nanostructure formation and structure analysis on hydrogen‐terminated Si(111) surfaceKuroiwa, N. / Fukushima, Y. / Rajasekar, P. / Neddermeyer, H. / Jalochowski, M. / Bauer, E. / Yasue, T. / Koshikawa, T. et al. | 2003
- 29
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Novel compositional accommodation mechanism in SrNbO3 epitaxial thin films revealed by analytical electron microscopyTakeno, S. / Ohara, R. / Sano, K. / Kawakubo, T. et al. | 2003
- 36
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Formation of promising Co–C nanocompositionsLavrentiev, V. / Abe, H. / Yamamoto, S. / Naramoto, H. / Narumi, K. et al. | 2003
- 40
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Characterization of ultrathin InAs quantum wells by TEM–cathodoluminescence and TEM techniquesGrillo, V. / Genseki, A. / Yamamoto, N. / Watanabe, Y. et al. | 2003
- 45
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Determination of 3D atomic structure of surfaces and interfaces by photoelectron holographyNihei, Yoshimasa et al. | 2003
- 51
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Phase reconstruction with simultaneous correction of spherical and astigmatic aberrations by three‐dimensional Fourier filtering methodKawasaki, Tadahiro / Takai, Yoshizo et al. | 2003
- 55
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Aberration‐free images observed with TEM and STEMShimizu, R. et al. | 2003
- 60
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Evaluation of high‐precision phase‐shifting electron holography by using hologram simulationYamamoto, Kazuo / Hirayama, Tsukasa / Tanji, Takayoshi / Hibino, Michio et al. | 2003
- 66
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Fe(O,OH)6 network structure of rust formed on weathering steelKimura, M. / Suzuki, T. / Shigesato, G. / Kihira, H. / Suzuki, S. et al. | 2003
- 72
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Real‐time observation of surface morphology at nanometer scale using x‐ray specular reflectionKawamura, T. / Watanabe, Y. / Fujikawa, S. / Bhunia, S. / Uchida, K. / Matsui, J. / Kagoshima, Y. / Tsusaka, Y. et al. | 2003
- 76
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X‐ray reflection from thin multilayers: symmetric patternsKarimov, Pavel / Harada, Shingo / Kawai, Jun et al. | 2003
- 80
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Atomic structure of Si(113) surface studied by coaxial impact collision ion scattering spectroscopyKim, K. S. / Choi, J. U. / Cho, Y. J. / Kang, H. J. et al. | 2003
- 84
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Monte Carlo study of the spin polarization enhancement in the low‐energy secondary electron emission from ferromagnetic materialsYasuda, Masaaki / Katsuse, Ryuhei / Kawata, Hiroaki / Murata, Kenji et al. | 2003
- 89
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Surface morphology and interface structural analyses of Ti(film)/SiC(substrate) by PEEM, SXES, AES and XRDLabis, Joselito / Ohi, Akihiko / Hirai, Masaaki / Kusaka, Masahiko / Iwami, Motohiro et al. | 2003
- 94
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Imaging micropatterned organosilane self‐assembled monolayers on silicon by means of scanning electron microscopy and Kelvin probe force microscopyWu, Yunying / Hayashi, Kazuyuki / Saito, Nagahiro / Sugimura, Hiroyuki / Takai, Osamu et al. | 2003
- 99
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AFM observation of nanosized SiC dots prepared by ion beam depositionXu, Y. / Narumi, K. / Miyashita, K. / Naramoto, H. et al. | 2003
- 104
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Ab initio molecular orbital calculation for hydrogen‐induced states of titanium (III)Hayashi, Kazuya / Nakagawa, Sachiko T. / Mizuno, Yoshiyuki / Tanaka, Akihiro / Homma, Teiichi et al. | 2003
- 108
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Distribution of lattice parameters in strain‐compensated MQW laser diodesSeo, Satoru / Matsuda, Takeyoshi / Mitose, Kengo / Iwase, Fusako et al. | 2003
- 113
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Coherent electron emission from carbon nanotubes: asymmetric young's interference fringesYamashita, T. / Matsuda, K. / Kona, T. / Mogami, Y. / Komaki, M. / Murata, Y. / Oshima, C. et al. | 2003
- 117
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Structural characterization of C60 nanowhiskers formed by the liquid/liquid interfacial precipitation methodMiyazawa, K. / Kuwasaki, Y. / Hamamoto, K. / Nagata, S. / Obayashi, A. / Kuwabara, M. et al. | 2003