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101–120 of 2,091 hits
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APPARATUS FOR TRAPPING ION WITHOUT EXPOSURE OF DIELECTRIC LAYER AND METHOD FOR FABRICATING THE SAME
Free accessEuropean Patent Office | 2016| -
MEMS-based 3D ion trapping device for using laser penetrating ion trapping structure, and method for manufacturing same
Free accessEuropean Patent Office | 2019| -
Shot-to-shot sampling using a matrix-assisted laser desorption/ionization time-of-flight mass spectrometer
Free accessEuropean Patent Office | 2020| -
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
Free accessEuropean Patent Office | 2020| -
DECONVOLUTION METHOD FOR IMAGE OBSERVED IN CHARGED PARTICLE BEAM APPARATUS IMAGE PROCESS APPARATUS AND CHARGED PARTICLE BEAM APPARATUS COMPRISING IMAGE PROCESS APPARATUS
Free accessEuropean Patent Office | 2023| -
ELECTRON OPTICAL SYSTEM AND MULTI-BEAM IMAGE ACQUIRING APPARATUS
Free accessEuropean Patent Office | 2020| -
ELECTRON MICROSCOPE AND METHOD OF ADJUSTING FOCUS OF ELECTRON MICROSCOPE
Free accessEuropean Patent Office | 2021| -
Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages
Free accessEuropean Patent Office | 2020| -
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL COMPUTED TOMOGRAPHY
Free accessEuropean Patent Office | 2023| -
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE ALIGNMENT METHOD OF CHARGED PARTICLE BEAM APPARATUS
Free accessEuropean Patent Office | 2023 -
Multiple electron beam image acquisition apparatus, and alignment method of multiple electron beam optical system
Free accessEuropean Patent Office | 2021| -
Ion beam source for optical device fabrication using a segmented ion source having one or more angled surfaces
Free accessEuropean Patent Office | 2023|
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